Acetone ≥99.5% (by GC), Finyte® for microelectronic, J.T.Baker®
Supplier: AVANTOR PERFORMANCE MATERIAL LLC
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Danger
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Synonyms:
2-Propanone, DMK, Propanone, Dimethyl ketone
Management of Change (MOC) category = R
5008-05
JT5008-5CS
198.34
USD
JT5008-5
Acetone ≥99.5% (by GC), Finyte® for microelectronic, J.T.Baker®
Acetone
Formula:
CH₃COCH₃ MW: 58.08 g/mol Boiling Pt: 56.2 °C (1013 hPa) Melting Pt: –95.4 °C Density: 0.792 g/cm³ (20 °C) Flash Pt: <–20 °C (closed cup) Storage Temperature: Ambient |
MDL Number:
MFCD00008765 CAS Number: 67-64-1 EINECS: 200-662-2 UN: 1090 ADR: 3,II REACH: 01-2119471330-49 Merck Index: 13,00067 |
Specification Test Results
For Microelectronic Use | |
Assay (by GC) | ≥99.5 % |
Color (APHA) | ≤10 |
Acidity (µeq/g) | ≤0.3 |
Aldehydes (as HCHO) | ≤20000 ppb |
Alkalinity (µeq/g) | ≤0.5 |
Isopropyl Alcohol (CH₃CHOHCH₃)(BY WT) | ≤0.05 % |
Methanol (CH₃OH)(BY WT) | ≤0.05 % |
Sulfate (SO₄), For Information Only | |
Residue after Evaporation | ≤3000.0 ppb |
Water (H₂O) | ≤0.50 % |
Solubility in H₂O | Passes Test |
Chloride (Cl) | ≤200.0 ppb |
Phosphate (PO₄) | ≤50.0 ppb |
Trace Impurities - Aluminum (Al) | ≤10.0 ppb |
Trace Impurities - Antimony (Sb) | ≤5.0 ppb |
Trace Impurities - Arsenic (As) | ≤5.0 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤10.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤10.0 ppb |
Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤10.0 ppb |
Trace Impurities - Gold (Au) | ≤10.0 ppb |
Trace Impurities - Iron (Fe) | ≤10.0 ppb |
Trace Impurities - Lead (Pb) | ≤10.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤10.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
Trace Impurities - Niobium (Nb) | ≤10.0 ppb |
Trace Impurities - Potassium (K) | ≤10.0 ppb |
Trace Impurities - Silicon | ≤10.0 ppb |
Trace Impurities - Silver (Ag) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤10.0 ppb |
Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤10.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤10.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count - 0.5 µm and greater | ≤50 par/ml |
Particle Count - 1.0 µm and greater | ≤8 par/ml |
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